Features

See SemiToolbox in Action

Progress indicator during STDF file loading

Overview of all STDF record types

PTR test data with time series charts

Visual bin analysis with Pareto charts

Test limits and statistics view

Wafer records and configuration

View all 28 STDF record types including FAR, MIR, MRR, PCR, HBR, SBR, PTR, MPR, FTR, and more. Comprehensive coverage of the STDF V4 specification.

Pivot table view of PTR and MPR records with devices as rows and tests as columns. Easy-to-read format for analyzing parametric test results.

Visualize hardware and software bin data with interactive Pareto charts. View bin counts by site with pivot table organization.

View test limits, statistics, pass rates, Cpk values, and test summaries. Filter by category and status for easy analysis.

Automatically handles compressed STDF files (.std.gz, .std.Z) with transparent decompression. No manual extraction needed.

View PMR (Pin Map), PGR (Pin Group), and PLR (Pin List) records for comprehensive pin configuration analysis.

Display WIR (Wafer Information), WRR (Wafer Results), and WCR (Wafer Configuration) records for wafer-level analysis.

View PIR (Part Information) and PRR (Part Results) records to track individual part test results and binning.

Analyze SDR (Site Description) records and RDR (Retest Data) records for comprehensive test site and retest information.

Quick overview of all record types in the file with clickable links to navigate directly to specific record views.

Clean, intuitive interface with tabbed navigation. Responsive design that works on all screen sizes.

Efficient parsing with progress indicators. Handles large STDF files quickly with optimized memory usage.

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